畢業(yè)論文外文翻譯-基于arm與線性ccd的高速數(shù)據(jù)采集系統(tǒng)

1、<p><b>　　畢業(yè)設(shè)計(jì)</b></p><p><b>　　中英文翻譯</b></p><p>　　學(xué)生姓名： 學(xué)號(hào)： </p><p>　　學(xué) 院： </p><p>　　專

2、 業(yè)： </p><p>　　指導(dǎo)教師： </p><p><b>　　2012年 6月</b></p><p>　　High–Speed Data Acquisition System Based on ARM &

3、 Linear-CCD</p><p>　　Dong Jianjun Zhao Xiaojin</p><p>　　Dept. Four, The First Aeronautical Technical College of the Air Force Xinyang 464000.China.</p><p>　　Abstract : This paper p

4、resents a high speed acquisition system of linear-CCD based on ARM, high-speed linear-CCD and high-speed ADC are selected. As the sampling speed of A/D is slower than the working clock frequency of ARM, CPLD and FIFO are

5、 used as I/O between A/D and ARM. It makes the circuit works harmonious, simple and easy controlling, and also increases the efficiency of ARM. In order to increase the communication speed, the Universal Serial Bus (USB)

6、 technology is adopted to communicate</p><p>　　Key Words : ARM; Linear CCD; Contact-line; Pantograph; Stagger –value </p><p>　　I. Introduction </p><p>　　In electrification railways,

7、 in order to extend the life of the pantograph on electric locomotives, so that the slider of pantograph wear evenly, the contact-line (electrified railway power feed line) in straight-line segments is arranged as zigzag

8、 route (curve section arranged in the form of polyline). The distance between the contact-line of positioning point and the pantograph centerline track is called out stagger-value, which is a key indicator of contact-lin

9、e .</p><p>　　Stagger-value can not be ignored, the value too small will affect the slider of pantograph wear evenly and the purpose of extending using life; otherwise, in some cases (such as caught in a stif

10、f winds), cause a large range of lateral movement of the roof (and the higher the speed, the greater pantograph swing around), some parts of contact-line will be in excess of the effective work length of pantograph, so t

11、hat the stagger-value of contact-line beyond the standard range, leading to deteriorat</p><p>　　II. System Components </p><p>　　System hardware components are shown in figure 1. </p><

12、p>　　The system consists of the following components: (1) using TOSHIBA Company’s high-speed linear array CCD to achieve the digitization of contact-line images (CCD output the signal of corresponding time sequence of

13、position); (2) using Atmel Company’s AT91RM9200 processor of ARM9 series to realize digital signal acquisition and processing; (3) using PDIUSBD12 USB interface device to complete the data communications between measurem

14、ent system and the PC. </p><p>　　Due to the characteristics of its improved Harvard structure, special instructions and quick to realize a variety of signal processing, ARM processor is widely used in image

15、 processing, communications, radar, sonar, precision machinery fields, etc. ARM processor is adopted for its arithmetic speed and bus width. As the real-time signal analysis and calculation require a high speed of comput

16、ing, Atmel Company’s ARM chip—AT91RM9200 is selected. The chip is ARM920T based, high-performance, low pow</p><p>　　Fig 1 System block diagram</p><p>　　III. Real-time processing and transmission

17、 of CCD digital image </p><p>　　In order to achieve real-time digital image </p><p>　　transmission, several major factors which affect real-time transmission should be necessary to solve: First,

18、 the speed of linear array CCD data acquisition; Second, the transmission speed between linear array CCD and ARM processor; the third is the data transmission speed between ARM processor and computer. The following will

19、be described in detail. </p><p>　　A. Linear array CCD acquisition speed </p><p>　　Acquisition speed is a critical performance indicator for image sensor, TOSHIBA Company’s TCD1209D linear array

20、CCD is used to meet the targets. Its clock pulse frequency can operate as high as 20MHz, especially suitable for high-speed conditions of size measurement and dynamic analysis.</p><p>　　Fig 2 Linear CCD TCD1

21、209D and its time sequence diagram</p><p>　　Linear array CCD TCD1209D and its time sequence diagram are shown in figure 2. </p><p>　　B.Transmission speed between CCD and ARM processor </p>

22、<p>　　In order to improve the speed of CCD data acquisition and reduce conversion time, adopting high speed A/D converter can make it exchange data with ARM processor at high-speed. ADC08200, Analog Company's

23、nanosecond conversion device is adopted. It’s a single-channel, 8-bit A/D converter, which operates over a wide range of temperature, converts fast, operates at conversion rates up to 230 MSPS, thus achieving entire sign

24、al acquisition of linear array CCD. ADC08200 is shown in figure 3.</p><p>　　Fig 3 High-speed A/D converter ADC080200</p><p>　　FIFO is used as a data buffer to co-ordinate the rate of ARM process

25、or and ADC. It is a two-port (input and output port) memory for temporary storage of first in first out data. Due to the time to write data to FIFO is far less than the A/D conversion time, therefore, the acquisition spe

26、ed depends on the A/D conversion speed. </p><p>　　In order to improve the speed of the entire measurement system, the time sequence of entire circuit is precisely controlled by the CPLD to make the circuit w

27、orks harmonious. CCD driving signal, integration time control, address decoding, A/D conversion control, data buffer and data acquisition logic functions integrate in the CPLD, so that the entire circuit structure is sim

28、ple and reliable. </p><p>　　In order to further enhance the system speed, when the system starts, system programs are transferred to high-speed SRAM for running and SDRAM for data storage; SRAM, SDRAM should

29、 be placed as close as possible to ARM processors, and the signal lines the shortest possible. </p><p>　　ARM processor (AT91RM9200), the signal processing core of the entire hardware system, read the CCD lig

30、ht intensity signal from FIFO, calculate the distribution of contact-line image in the CCD with corresponding algorithm, and transfer the result to the slave computer through USB. </p><p>　　C. Transmission s

31、peed between ARM processor and computer </p><p>　　In order to increase the speed of data transmission and reduce transmission delay, USB interface is used for data transmission. USB1.1 interface support low-

32、speed and full-speed transmission, data transfer rates has reached 1.5Mbps in low-speed mode, the transmission speed up to 12Mbps in full speed mode. Philips Company’s PDIUSBD12 is adopted. </p><p>　　When a

33、USB device inserted into the PC, PC enumerates USB device automatically. When detecting equipment to insert, PC send query request. USB devices respond to the request and send equipment Vendor ID and Product ID; PC loads

34、 the corresponding device driver with these two ID to complete the enumeration process. </p><p>　　PC-side USB device driver is completed by WinDriver. Data communication between PC and USB equipment mainly i

35、ncludes two aspects: first, read the sample data; second, send control commands to the acquisition system. </p><p>　　IV. CCD image recognition algorithm </p><p>　　ARM processor is mainly respons

36、ible for the solution of stagger-value; it’s the process of image identification, including background separation and feature extraction of the image data. Identification of the image is for image gray only; the standard

37、 deviation threshold tracking method is adopted. The image is composed of black-and-white texture, and gray-scale varies greatly, with a larger standard deviation; and background gray distribution is relatively flat, wit

38、h small standard deviation. T</p><p>　　This system not only measures the contact-line instant position, but also calculates the abrasion state of the contact-line to evaluate its life span. System support by

39、 associated PC software, through subsequent playback of the data collected, to check the situation of stagger-value, as well as the abrasion of contact-line, and decide whether to adjust and replace or not</p><

40、;p>　　V. Measures of improving system reliability </p><p>　　High-speed data acquisition system is inevitably affected by interference from the external environment. As the complex environment around the me

41、asurement system, many factors interfere with the system. Electromagnetic interference around 27.5KV high-voltage catenary affects great; the pantograph detaching will be accompanied by the emergence of arc sparks, this

42、phenomenon interfere with communication line along the lines, accompanied by high-frequency electromagnetic waves, therefore, necessary</p><p>　　VI. Results </p><p>　　We have used this high–spee

43、d data acquisition system in Wuhan south locomotive-depot to measure the contact-line instant position, and the test result shows that the whole system works effective, fast and high degree of accuracy; exclude the vibra

44、tion of the train and the contact-line, it reach the accuracy of 0.1mm. This design is flexible and corresponds with the actual needs. </p><p>　　REFERENCES </p><p>　　[1] Yu Wanju. Design and th

45、e Measurement Theory of Contact-line [M], Beijing, China Railway Publishing House, 1991. </p><p>　　[2] Zhu Feixiong. Detection of Stitched catenary suspension [J], Electric Railway, 2003,(1):15-17 </p>

46、;<p>　　[3] Li Weimin, Xing Xiaozheng. Application of DSP in the Linear CCD measuring system [J], Chinese Journal of Scientific Instrument, 2003,(2):183-185 </p><p>　　[4] Huang Zhengjin, Xu Jian. Int

47、roduction to CPLD system design and application technology [M], Beijing, Publishing House of Electronics Industry, 2002. </p><p>　　[5] Cao Xiaowei. The principle and application of high-speed high-precision

48、 linear array CCD-TCD141C [J], International Electronic Elements, 1997,(8):26-29 </p><p>　　[6] Bi Youming, Yang Tiemei. High-speed data acquisition and processing system for linear CCD [J], Journal of Taiyu

49、an University of Science and Technology, 2000, (1): 31-33 </p><p>　　[7] Wang Ning, Shan Shengxiong. Analysis of the contact force between pantograph and catenary [J], Electric Railway, 2000, (2): 22-24 <

50、/p><p>　　[8] Bai Dongliang. A new structure of the pantograph——Self-detaching pantograph [J], Electric Drive for Locomotives, 1999, (6): 42-43 </p><p>　　[9] He Duyang, Huang Xiaodong, He Kui. The

51、 Width Measuring Instrument for Steel Plate by Linear CCD Technology. Technology and Test. 2007, 5:64-66. </p><p>　　[10] Wang Qingyou, Zhang Kexin, Jin Gui, Liu Haijun. Design of linear CCD real-time test s

52、ystem based on DSP. Electronic Measurement Technology, 2007, 30(7): 85-86. </p><p>　　[11] Zhong Hongtao, Duan Fajie, Wang Xueying, YE Shenghua. Design of CCD Driver on Auto-adjust Exposure Time. Chinese Jou

53、rnal of Sensors and Actuators.2006, 19(6):2256-2259. </p><p>　　Dong JianJun, Master, Lector， The First Aeronautical Technical College of the Air Force. Xinyang 464000. China. Email: dbrother@163.com </p

54、><p>　　Zhao Xiaojin, Master, College of Mechanical and Electrical Engineering, Xi’an University of Architecture & Technology, Xi’an 710055.China. Email: zhaoxiaojin@163.com</p><p>　　基于ARM與線性CCD

55、的高速數(shù)據(jù)采集系統(tǒng)</p><p><b>　　摘要</b></p><p>　　本文介紹了一個(gè)基于ARM的線性CCD高速采集系統(tǒng)，系統(tǒng)中選擇了高速線性CCD和高速ADC。因?yàn)锳DC的采樣速度相對(duì)ARM的工作時(shí)鐘頻率較慢，所以使用CPLD和FIFO作為A/D和ARM之間的I/O接口。它使電路工作在更加平穩(wěn)、簡(jiǎn)潔而易于控制，同時(shí)也提高了ARM的工作效率。為了提高通信速度

56、，這里采用通用串行總線（USB）技術(shù)來(lái)與PC進(jìn)行通信。 ARM是用來(lái)控制主處理器的數(shù)據(jù)采集，數(shù)據(jù)的計(jì)算和數(shù)據(jù)傳輸。結(jié)果證明，整個(gè)系統(tǒng)能高效運(yùn)作。該系統(tǒng)可應(yīng)用于高速數(shù)據(jù)采集及多路模擬信號(hào)的工作環(huán)境下。</p><p>　　關(guān)鍵詞：ARM；線性CCD；接觸線；受電弓；錯(cuò)開(kāi)值</p><p><b>　　1 引言</b></p><p>　　在電氣

57、化鐵路，為了擴(kuò)大對(duì)電力機(jī)車受電弓的壽命，所以要使受電弓滑塊磨損均勻，接觸線的直線段（電氣化鐵路供電線）排列為曲折路線（彎段被安排成折線的形式）。之間的接觸線的定位點(diǎn)和受電弓軌道中心線距離稱為錯(cuò)開(kāi)值，這是一種接觸線的關(guān)鍵指標(biāo)。</p><p>　　錯(cuò)開(kāi)值是不可忽視的，這個(gè)值過(guò)小會(huì)影響到受電弓滑塊磨損的均勻性，從而影響到延長(zhǎng)使用壽命的目的，然而，在某些情況下（比如陷入了激烈的風(fēng)中），造成大范圍的在屋部的橫向運(yùn)動(dòng)（并且

58、速度越快，受電弓的左右擺動(dòng)越劇烈），接觸線將在某些部分將會(huì)超過(guò)受電弓的有效工作長(zhǎng)度，從而使錯(cuò)開(kāi)，接觸線值超出標(biāo)準(zhǔn)范圍的錯(cuò)開(kāi)值，導(dǎo)致了當(dāng)前連接的破壞，甚至導(dǎo)致了會(huì)產(chǎn)生受電弓事故的錯(cuò)誤運(yùn)行。受電弓與滑觸線發(fā)生故障，將導(dǎo)致列車正常運(yùn)行的中斷，從而對(duì)鐵路運(yùn)輸產(chǎn)生嚴(yán)重的影響。為了避免這些情況，錯(cuò)開(kāi)值及其變化應(yīng)經(jīng)常性地予以測(cè)試。因此，一個(gè)機(jī)車的接觸線式在線監(jiān)測(cè)系統(tǒng)，及與其配套的數(shù)據(jù)采集系統(tǒng)被開(kāi)發(fā)出來(lái)，它的工作是實(shí)時(shí)地、迅速地計(jì)算錯(cuò)開(kāi)值。</p

59、><p><b>　　2 系統(tǒng)組件</b></p><p>　　系統(tǒng)硬件組成如圖1所示。</p><p>　　該系統(tǒng)由下列部分組成：（1）采用東芝公司的高速線陣CCD實(shí)現(xiàn)接觸線影像的數(shù)字化（CCD輸出對(duì)應(yīng)的時(shí)間序列位置的信號(hào)），（2）采用Atmel公司ARM9系列處理器中的AT91RM9200，實(shí)現(xiàn)了數(shù)字信號(hào)的采集和處理；（3）采用PDIUSBD

60、12的USB接口設(shè)備，完成測(cè)量系統(tǒng)與PC機(jī)之間的數(shù)據(jù)通訊。</p><p>　　由于它改進(jìn)型的哈佛結(jié)構(gòu)，特殊的指令系統(tǒng)以及迅速實(shí)現(xiàn)各種信號(hào)處理的特點(diǎn)，ARM處理器被廣泛應(yīng)用于圖像處理，通信，雷達(dá)，聲納，精密機(jī)械等領(lǐng)域。ARM處理器正因其算術(shù)速度和總線寬度而被采用。隨著實(shí)時(shí)信號(hào)分析和計(jì)算都需要很快運(yùn)算速度，所以系統(tǒng)選擇了ATMEL公司的ARM芯片AT91RM9200。該芯片是基于ARM920T的，高性能，低功耗的1

61、6/32位RISC（精簡(jiǎn)指令集計(jì)算機(jī)）微控制器，它集成了一套豐富的外圍設(shè)備的應(yīng)用，并在那些需要一大批外圍設(shè)備，并能在低功耗的外設(shè)和嚴(yán)格穩(wěn)定工作的工業(yè)控制應(yīng)用中，提供了一個(gè)單芯片的解決方案。</p><p>　　圖1 系統(tǒng)硬件組成</p><p>　　3 CCD數(shù)字圖像的實(shí)時(shí)處理與傳輸</p><p>　　為了實(shí)現(xiàn)實(shí)時(shí)的數(shù)字圖像的傳輸，幾大影響實(shí)時(shí)傳輸?shù)囊蛩貞?yīng)該予

62、以解決：第一，線陣CCD的數(shù)據(jù)采集速度；二是線陣CCD和ARM處理器之間的傳輸速度；第三是ARM處理器和計(jì)算機(jī)之間的數(shù)據(jù)傳輸速度。下面將給以詳細(xì)描述。</p><p>　　線陣CCD的采集速度</p><p>　　采集速度對(duì)于圖像傳感器來(lái)說(shuō)，是一個(gè)關(guān)鍵的性能指標(biāo)，這里采用東芝公司的TCD1209D線陣CCD來(lái)滿足目標(biāo)要求。它可工作在可高達(dá)20MHz的時(shí)鐘脈沖頻率下，所以對(duì)高速條件下的尺寸測(cè)

63、量和動(dòng)態(tài)分析特別適合。</p><p>　　圖2 TCD1209D及它的時(shí)序</p><p>　　線陣CCD TCD1209D，以及它的時(shí)序圖如圖2所示。</p><p>　　B.CCD和ARM處理器之間的傳輸速度</p><p>　　為了提高CCD的數(shù)據(jù)采集速度，減少轉(zhuǎn)換時(shí)間，現(xiàn)使用高速A/D轉(zhuǎn)換器，以使它在高速環(huán)境下與ARM處理器進(jìn)行數(shù)

64、據(jù)交換。這里選擇ADC08200，Analog公司的一個(gè)納秒級(jí)轉(zhuǎn)換器。這是一個(gè)單通道，8位的A/D轉(zhuǎn)換器，它可以在一較寬的溫度范圍內(nèi)工作，轉(zhuǎn)換速度快，工作時(shí)的轉(zhuǎn)換速率高達(dá)230 MSPS，從而實(shí)現(xiàn)整個(gè)線陣CCD的信號(hào)采集。ADC08200如圖3所示。</p><p>　　圖3 ADC08200</p><p>　　FIFO用于作為數(shù)據(jù)緩沖區(qū)，協(xié)調(diào)了ARM處理器和ADC的速率。這是一個(gè)兩端

65、口（輸入和輸出端口）的，臨時(shí)性存儲(chǔ)的，先入先出的數(shù)據(jù)存儲(chǔ)器。由于向FIFO中寫入數(shù)據(jù)的時(shí)間遠(yuǎn)遠(yuǎn)小于A/D轉(zhuǎn)換的時(shí)間，因此，數(shù)據(jù)采集的速度取決于A/D轉(zhuǎn)換的速度。</p><p>　　為了提高整個(gè)測(cè)量系統(tǒng)的速率，整個(gè)電路的時(shí)序是由CPLD的精確控制，以使電路協(xié)調(diào)地工作。 CCD驅(qū)動(dòng)信號(hào)，積分時(shí)間控制，地址譯碼，A/D轉(zhuǎn)換控制，數(shù)據(jù)緩沖和數(shù)據(jù)采集邏輯功能都集成在CPLD上，使得整個(gè)電路結(jié)構(gòu)簡(jiǎn)單，功能可靠。</p

66、><p>　　為了進(jìn)一步提高系統(tǒng)的速度，當(dāng)系統(tǒng)啟動(dòng)時(shí)，系統(tǒng)程序被傳送到高速SRAM去運(yùn)行，并且使用高速SRAM來(lái)存儲(chǔ)數(shù)據(jù)；SRAM，SDRAM應(yīng)盡量靠近ARM處理器放置，而信號(hào)線應(yīng)盡可能地最短。</p><p>　　ARM處理器（AT91RM9200）作為整個(gè)硬件系統(tǒng)的信號(hào)處理內(nèi)核，需要讀取存儲(chǔ)在FIFO中的CCD光強(qiáng)信號(hào)，應(yīng)用相應(yīng)的算法計(jì)算CCD中接觸線圖像的分布，并通過(guò)USB把結(jié)果傳送給從

67、屬計(jì)算機(jī)。</p><p>　　C.ARM處理器和計(jì)算機(jī)之間的傳輸速度</p><p>　　為了提高數(shù)據(jù)傳輸速度，減少傳輸延遲，USB接口用于數(shù)據(jù)傳輸。 USB1.1接口支持低速和全速傳輸，數(shù)據(jù)傳輸速率在低速模式下已經(jīng)達(dá)到了1.5Mbps，全速模式下傳輸速率可達(dá)12Mbps。這里采用飛利浦公司的PDIUSBD12。</p><p>　　當(dāng)一個(gè)USB設(shè)備插入到PC，P

68、C機(jī)會(huì)自動(dòng)枚舉USB設(shè)備。當(dāng)檢測(cè)設(shè)備插入時(shí)，電腦發(fā)送查詢請(qǐng)求。 USB設(shè)備便響應(yīng)請(qǐng)求并發(fā)送設(shè)備供應(yīng)商的ID和產(chǎn)品的ID；電腦根據(jù)這兩個(gè)ID加載相應(yīng)的設(shè)備驅(qū)動(dòng)程序以完成枚舉過(guò)程。</p><p>　　PC端的USB設(shè)備驅(qū)動(dòng)程序由WinDriver完成編寫。 PC與USB設(shè)備之間的數(shù)據(jù)通信主要包括兩個(gè)方面：首先，閱讀樣本數(shù)據(jù)；第二，發(fā)送控制命令到數(shù)據(jù)采集系統(tǒng)。</p><p>　　4 CCD

69、圖像識(shí)別算法</p><p>　　ARM處理器主要負(fù)責(zé)錯(cuò)開(kāi)值的解決；這是個(gè)圖像識(shí)別的過(guò)程，包括背景的分離和圖像數(shù)據(jù)中特征的提取。圖像識(shí)別只在于圖像的灰度；這里采用標(biāo)準(zhǔn)差閾值法進(jìn)行跟蹤。該圖像是由黑色和白色紋理組成的，并且灰度變化較大，有很大的標(biāo)準(zhǔn)偏差；還有背景灰度分布較為平滑，有較小的標(biāo)準(zhǔn)偏差。因此，把每個(gè)點(diǎn)作為它那一組像素點(diǎn)的中心，計(jì)算出它的標(biāo)準(zhǔn)偏差，得出值超過(guò)一定的閾值的點(diǎn)確定為前臺(tái)點(diǎn)，或作為背景。</

70、p><p>　　該系統(tǒng)不僅是測(cè)量接觸線的即時(shí)位置，還計(jì)算了接觸線的磨損程度，以評(píng)估它的使用壽命。通過(guò)隨后對(duì)采集到數(shù)據(jù)的回放，相關(guān)的PC軟件支持著系統(tǒng)來(lái)檢查錯(cuò)開(kāi)值的情況，以及接觸線磨損，并且決定是否予以調(diào)整和更換。</p><p>　　5 提高系統(tǒng)可靠性的措施</p><p>　　高速數(shù)據(jù)采集系統(tǒng)會(huì)不可避免地受到外部環(huán)境的干擾。由于測(cè)量系統(tǒng)周圍復(fù)雜的環(huán)境，許多因素會(huì)干擾

71、到系統(tǒng)。27.5KV的高壓滑觸線周圍的電磁干擾所產(chǎn)生的影響很大；受電弓的分離將帶來(lái)電弧火花，這種現(xiàn)象會(huì)干擾通訊線路沿線的高頻電磁波，因此，需要采取一些必要的抗干擾措施。為了提高抗干擾能力，這里采用的抗干擾措施如下：采取抗干擾的PCB電路設(shè)計(jì)，以減少系統(tǒng)的外部干擾；所有電纜都采用帶有波防套的防護(hù)型電纜；設(shè)備的外殼采用屏蔽性材料和用于檢測(cè)的窗口，這些外殼使用紗布來(lái)隔離干擾。</p><p><b>　　6