基于壓縮測試矢量后復(fù)用系統(tǒng)總線傳輸?shù)臏y試方案.pdf

1、東南大學(xué)碩士學(xué)位論文基于壓縮測試矢量后復(fù)用系統(tǒng)總線傳輸?shù)臏y試方案姓名：桑偉偉申請學(xué)位級別：碩士專業(yè)：微電子學(xué)與固體電子學(xué)指導(dǎo)教師：陸生禮20040307查墮查蘭堡!：蘭竺絲苧AbstractWiththedevelopmentofICmanufactureandtheincreasingofchipsize，testcompactionandapplicationtechnologycriesfortherelevantbreakthr

2、oughSomemethodsshouldbefoundtoresolvethesequestionsabouttesttimeandareaoverheadTodecreasethetesltimeofthetestpatterntransportationandthetestsiliconoverhead，thispaperproposedanovelmethodthatisatestaccessmechanismbasedonsy

3、stemreusablebustransportationaftertestcompactionThismethodisverygoodfordecreasingthetestsetsizesandtestmemoryoverheadFirstly，theactualityoftestcompactiontechnologyandtheAMBAtestsystembusprotocolareintroducedSimultaneousl

4、ythereisalsoanintroductionaboutATLANTAwhichisanacademiccombinatorialfaultsimulationandATPGsoftwareAtierwards，ascanchainoptimizationalgorithminMulticapturestructurewithmultiplescanchainsisproposedinthe3“chapterThisalgorit

5、hmconstructsmultiplescanchainswithminimumeorrelativityofregisters，whichisusedinMulticapturestructureinwhichtestresponsesa∞r(nóng)efedtoregistersandprimaryinputs，TheexperimentdataofthisarithmeticbycomparingwithMScompressionalea

6、nalyzedIntheforthchapterMISRisusedtocompressresponses，andthealiasingisgottenbyexperimentsversustheresultscomputedfromthetheoryformulaofaliasingprobabilityFinallytheMCtestprotocol，thedesignofSTIC，andsimulatingtheSOCtestof

7、theMCcircuitsaredescribedExperimentsshowthattheoptimizationofthisATPGalgorithmcanbeaboutupto30％onaverageAndtheAliasingofMCstructurefullyaccordswiththetheoryformulaafterthecompressionofsingleMISRThemassofbenchmarkcircuits

8、arezeroaliasingMoreoverwhentheratioofPLLisequalto4，thetesttimeonlyis10％ofthetraditionalmethods’duringtheexperimentofMCvectorssimulationAlloftheserelevantexperimentsshowthatthetestaccessmechanismbasedonsystemreusablebustr