CoSi-,2-和ZrCr-,2-金屬間化合物微結(jié)構(gòu)的高分辨透射電鏡研究.pdf

1、上海交通大學(xué)碩士學(xué)位論文CoSi和ZrCr金屬間化合物微結(jié)構(gòu)的高分辨透射電鏡研究姓名：周鷗申請學(xué)位級別：碩士專業(yè)：材料學(xué)指導(dǎo)教師：孫堅20070101IIHRTEMSTUDYOFMICROSTRUCTUREINCoSi2ZrCr2INTERMETALLICCOMPOUNDSABSTRACTHighresolutiontransmissionelectronmicroscopy(HRTEM)isapowerfulmeansfidentif

2、icationstudyofmaterialmicrostructure.AttributedtothedevelopmentofHRTEMwecanmakeuseofittoinvestigatethemicrostructureofmaterialsonatomicscales.themaincontentofthispaperistakingadvantagesofHRTEMtoinvestigatethemicrostructu

3、reduringannealingofamphousCoSi2CoSi2withadditionof5at%ZrfilmsthemicrostructureofZrCr2Zr(CrV)2Lavesphasewithadditionof2at%VstudytheinfluencemechanismofternaryalloyingontheZrCr2Lavesphasestability.TheresultsofTEMobservatio

4、nindicatethatamphousCoSi2filmafterannealedat250℃remainsamphousstructureshowingthemphologyoffinefiber.Afterannealedat350℃amphousCoSi2filmstartstocrystallizepartlythecrystalphasesareCoSiwithalittleofCoSi2whilethemphologyof

5、finefiberdoesn’tchange.TheamphousCoSi2withadditionof5at%Zrfilmcrystallizesafterannealedat550℃withsingleCoSi2phase.themphologyremainsfiberstructureatthisconditionmostly.Afterannealedat800℃thefilmcrystallizes.BesidesCoSi2p

6、hasethereisZrSi2phasecrystallizedout.Themphologyoffinefibertransfmstofineequiaxiscrystalstructure.TakingadvantagesofHRTEMtostudythemicrostructureattheinterfacebetweenfilmsputteredSisubstrateonatomicscale.Attheinterfacebe

7、tweenamphousCoSi2withadditionof5at%Zrfilm(100)Sisubstrateafterannealedat550℃CoSi2interfacialreactivephasewith(100)CoSi2(100)‖Si[011－]CoSi2[01‖1－]SirelationshipwhichisthesameasSiisfirstfound.Whiletwinnedrelationshipsbetwe