電子散斑干涉技術(shù)及條紋圖信息提取的研究.pdf_第1頁
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1、南京航空航天大學(xué)碩士學(xué)位論文電子散斑干涉技術(shù)及條紋圖信息提取的研究姓名:孫衍國申請學(xué)位級別:碩士專業(yè):測試計量技術(shù)及儀器指導(dǎo)教師:王海濤2011-01電子散斑干涉技術(shù)及條紋圖信息提取的研究 ii ABSTRACT Electronic Speckle Pattern Interferometry technology(ESPI)is a modern optical measurement technology which combin

2、es laser technology, video technology, computer technology, image processing technology, speckle interferometry technology. It has the merits of whole field, non-contact, high precision, so it is widely used optical roug

3、h surface deformation and displacement measurement, comparatively regarded in Nondestructive Testing, gradually developed in different application fields. This master's thesis studies the speckle interferometry and f

4、ringe information extraction, where information extraction for speckle fringes is the important step of optical measurements using of ESPI.First we introduced speckle interferometry technology development and application

5、 profiles, and then introduced the principle of speckle interferometry, fringe pattern generation mode, and disposal methods, made analysis and comparison of three fringe pattern generation mode and using correlation mod

6、e to generate fringe pattern of non-multiplicative noise. We study filtering techniques of fringes, and make comparison of fringes' filtering effect with different noise filtering algorithm for subsequent information

7、 extraction. We studied fringe center for the extraction of phase, focused on fringe skeleton extraction, made comparison and analysis of different thining methods, we made an improvement of speed and accuracy combining

8、the two thining methods, and used the improved thining method to obtain skeleton from single speckle fringe pattern of deformation measurement experiment, and recovered the phase of deformation with back propagation neur

9、al networks. We used the method of phase shifting to get wrapped phase map of the deformation, made comparison and analysis of phase unwrapping results with several typical unwrapping algorithm, and improved the accuracy

10、 of phase unwrapping with the introduction of quality map phase unwrapping method by identifying residual, and finally got the phase information of specimen deformation. With the effective extraction of speckle fringe in

11、formation, we got the phase field of the deformation of the specimen, reflected the real deformation of the specimen, and then we obtained the displacement or deformation information, and improved the accuracy and automa

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