邊界掃描測試技術的研究與應用.pdf

1、華中科技大學碩士學位論文邊界掃描測試技術的研究與應用姓名：趙冰茹申請學位級別：碩士專業(yè)：模式識別與智能系統(tǒng)指導教師：沈緒榜2002.5.13華中科技大學碩士學位論文ABSTRACTWiththerapiddevelopmentofVLSI，highintegrationlevelofICandincreasingcomplexityofPCB，thetraditionalphysicalcontacttestmethodcan’tsat

2、isfythenewrequestforlestThisthesisissubtaskofnational，s95tasktheMPPComputerBasedOIlboundaryscantesttechniquethisthesisresearchedtheMPPcomputer’SDFTdesignandtestingproblemThisthesisupdatedthecontrolledcomponentandtestsyst

3、emthatwerefinishedduring85andimprovedthatfeasibilityThisthesiSresearchedtheBoundaryScanTestStandard’sproviSionsforthetestiaStructionsandalIkindsOfregistersOfthisarchitecture’Scontrolledcomponentandthenrenewedthelogicalde

4、signofoldcontrolledcomponentThenewonecould；upportallsevenopentestinstructionsinsteadofonlysupport4testinstructionsSecoudlY，thisthesisamelioratedtheboundarySCantestsvstemandSOftware0ackage，whichbasedontheLISHANmicroelectr

5、oniccompany’SLS—JTAG30uudaryscanmasterchipThissystemcalltestallchips。PCBsanddigitalsystemsthataccordWiththiSStandardThetestCOde’sCOmpilertookanewprogrammingthought，Whichcouldavoidtheerrorscausedbyperson’soperationsandmak

6、efastthetestcode’ScreatingspeedInaddition，thisthesis13toughtOUtanewandCOmmoilmethodteSOlvetheC10ck“smallPinnacle”13roblemthatoCCurredinchip’StestThismethodWasappliedinMPPcomputer’stwo—phasechip’Stestandvalidateditsrightn

7、essThetestsystemappliedintestingMPPcomputer’scomponentandits1‘esuItiSalITIOStsameWithothertestdevices’result，whichindicatedthistestsvstem’SfeasibilityandreliabilityAllresearchresultilluminatedthat：theLS—JTAGboundaryscant

8、estsystemcaneffectivelysatisfythenewrequestforchip’s109icaltestandsystemtestIthashighpracticalvalueKeywords：DesignForTestability；BoundaryScanTest；IEEEll491Standard；Controlledcomponent；TAPcontroller；LSJTAGtestsystem，●●___